Costco is testing a new checkout process where an employee pre-scans the items in a customer's cart so the customer simply ...

The pilot program aims to ease congestion, though early feedback suggests it’s not a smooth ride just yet.

Yield improvement at sub 100-nm technologies relies on the latest scan test techniques. As IC feature sizes shrink below 90 nm, in-line inspection techniques to determine yield-limiting problems ...

For decades, process and design scaling has triggered the adoption of transformative test solutions. About twenty years ago, when at-speed test became a de-facto requirement, on-chip compression ...